Device Name: Cold-Hot Shock Rapid Temperature Change Comprehensive Test Chamber

Manufacturer:Jufu Instruments (Suzhou) Co., Ltd.

Function Introduction:

This device is used for temperature cycling tests to determine the ability of components to withstand extreme high and low temperatures, mainly used in screening tests and Group C quality consistency inspections.

Performance Introduction:

Instrument performance parameters: -65°C, +175°C

High-low temperature conversion time ≤ 1 minute, three-chamber design

Device Name: Liquid-Type Cold-Hot Shock Test Machine

Manufacturer:Jufu Instruments (Suzhou) Co., Ltd.     

Function Introduction:

This device is used to determine the resistance of components to sudden temperature changes and the effects of these changes, mainly used in screening tests.

Performance Introduction:

Instrument performance parameters: -65°C, +150°C, high-low temperature conversion time within 10 seconds.

Device Name:Cold-Hot Shock Test Chamber (Commonly Used)

Manufacturer:Japan Espec

Function Introduction:

This device is used for temperature cycling tests to determine the ability of components to withstand extreme high and low temperatures, mainly used in screening tests and Group C quality consistency inspections.

Performance Introduction:

Instrument performance parameters: -65°C, +175°C

Temperature conversion t ≤ 1 min, two chambers

Device Name: Low Temperature Freezer

Manufacturer: Japan SANYO

Function Introduction:

This device is used to determine the capability of devices to withstand extreme low temperatures, mainly used in screening tests.

Performance Introduction: Instrument performance parameter: -80 degrees

Device Name: Oven (2 units)

Manufacturer: Chongqing SIDA Instrument Company

Function Introduction:

This device is used for stability baking tests, to screen or eliminate borderline qualified devices, mainly used in screening tests and quality consistency checks of Group C.

Performance Introduction:

Instrument performance parameters: Temperature range 0℃～300℃

Device Name: High Temperature Test Chamber

Manufacturer: Shanghai Espec

Function Introduction:

This device is used for stability baking tests, to screen or eliminate borderline qualified devices, mainly used in screening tests and quality consistency checks of Group C.

Performance Introduction:

Instrument performance parameters: Temperature range 0℃～300℃

Device Name: High Temperature Test Chamber (2 units)

Manufacturer: Shanghai Espec

Function Introduction:

This device is used for stability baking tests, to screen or eliminate borderline qualified devices, mainly used in screening tests and quality consistency checks of Group C.

Performance Introduction:

Instrument performance parameters: Temperature range 0℃～200℃

Device Name: High Temperature Reverse Bias Testing System (5 units, commonly used)

Function Introduction:

This device can perform high-temperature reverse bias tests and power aging tests on various packaged diodes, transistors, field effect transistors, and thyristors. It is mainly used in screening tests and quality consistency checks of Groups B and C.

Performance Introduction:

Instrument performance parameters: Temperature range 0℃～200℃, aging dedicated power supply 1000V/0.5A, 1500V/0.3A, 300V/4.0A, 600V/1.0A, 1500V/0.5A, 5500V/0.1A

Manufacturer: Hangzhou Zhong'an Electronics Co., Ltd.

Device Name: High Temperature Dynamic Aging System (2 units)

Manufacturer: Hangzhou Zhong'an Electronics Co., Ltd.

Function Introduction:

This device can perform high temperature dynamic (static) aging tests on various packaged integrated circuits, to screen or eliminate borderline qualified devices, mainly used in screening tests and quality consistency checks of Group C.

Performance Introduction:

Instrument performance parameters: Four independent aging zones, 1 digital signal waveform generator, 4 analog signal generators, temperature range 0℃～200℃, dedicated aging power supply Vcc=18V/10A, Vmux=18V/10A, Vclk=18V/5A, Vee=18V/10A

Device Name: High Power Transistor Aging System

Manufacturer: Hangzhou Zhong'an Electronics Co., Ltd.

Function Introduction:

This device can meet the requirements for various packaging forms, allowing for aging tests of high-power transistors with rated power from 20W to 100W, as well as steady-state lifetime tests and power aging screening of power devices such as field effect transistors.

Performance Introduction:

Instrument performance parameters: 12 test zones, shell temperature controlled at 60℃～125℃, dedicated aging power supply, output voltage 0V～40V, 0V～60V, output current 0V～60A, 0V～40A

Device Name:Power Cycling Test System (Commonly Used)

Manufacturer: ITC Integrated Technology Co., Ltd.

Function Introduction:

This device is suitable for steady-state life tests (OPLIFE) and intermittent life tests (POWERCYCLING) of discrete devices such as transistors in various packages.

Performance Introduction:

Instrument performance parameters: Output voltage 0V--24V, 0V--48V, output current 150mA

Device Name:Programmable Constant Temperature and Humidity Test Chamber (Commonly Used)

Manufacturer: Jufu Instruments (Suzhou) Co., Ltd.

Function Introduction:

This device is used for humidity tests and double 85 (H3TRB) tests, assessing the ability of devices to resist degradation under high temperature and humid conditions, mainly used in screening tests and quality consistency checks of Group D.

Performance Introduction:

Instrument performance parameters: Temperature range -20℃～100℃, humidity range 10%RH-98%RH

Device Name:

Manufacturer: Tianjin Testing Equipment Factory

Function Introduction:

This device is used for double 85 (H3TRB) tests, assessing the ability of devices to resist degradation under high temperature and humid conditions, mainly used in screening tests.

Performance Introduction:

Instrument performance parameters: Temperature range 0℃～100℃, humidity 98%

Device Name:

Manufacturer: Agilent Agilent Technologies

Function Introduction:

This device is a set of automated leak detection equipment specifically designed for fine inspection of electronic components such as integrated circuits, mainly used in screening tests, quality consistency checks of Group C, acceptance tests, and DPA tests.   

Performance Introduction:

Device Name: Helium Fluorinated Oil Pressure Leak Detection System

Manufacturer:Zhongke Kekyi Technology Development Co., Ltd.

Function Introduction:

This device is a set of automated leak detection pressure systems specifically designed for fine and gross inspections of integrated circuits and other electronic components, mainly used in screening tests, Group C quality consistency inspections, acceptance inspections, and DPA tests.      

Performance Introduction:

Instrument performance parameters: Charging pressure: ≤1.0MPa

Device Name: Heavy Fluorinated Oil Heater

Manufacturer:TRIO-TECHYuda Company

Function Introduction:

This device is an automated leak detection system specifically designed for gross inspections of integrated circuits and other electronic components, mainly used in screening tests, Group C quality consistency inspections, acceptance inspections, and DPA tests.  

Performance Introduction:

Instrument performance parameters: From room temperature to 125°C ≤ 30 minutes

Device Name: Composite Loop Corrosion Salt Fog Test Chamber

Manufacturer:Jufu Instruments (Suzhou) Co., Ltd.

Function Introduction:

This device can perform high-temperature and high-humidity salt fog tests, using accelerated corrosion tests to simulate the effect of sea air on components and encapsulated parts, mainly used in screening tests and Group D quality consistency inspections.

Performance Introduction:

Instrument performance parameters: Laboratory: Room temp～50°C

Salt water mist pool: Room temp～50°C

Air humidifier bucket: Room temp～63°C

Salt water spray volume: Adjustable between 1.0～2.0ml/80sq.cm/hr

Device Name: Mechanical Impact Tester

Manufacturer:SuzhouSushe Company

Function Introduction:

This device is used to determine the impact resistance of components, mainly used in screening tests.

Performance Introduction:

Instrument performance parameters: Weight less than 100Kg, maximum drop height is 1600mm, peak acceleration of impact pulse is 1500g, impact pulse is half-sine wave, trapezoidal wave.

Device Name: High-Temperature Reverse Bias Test System

Manufacturer: Hangzhou Zhongan

Function Introduction:

This device can perform high-temperature reverse bias tests on various packaged diodes, transistors, FETs, and SCRs, etc., semiconductor discrete devices, used to evaluate the reliability and consistency of components;

Performance Introduction:

Test voltage 0~3000V, temperature range: 0~150°C