Device Name: PVA Acoustic Scanning Microscope

Manufacturer: PVATePLa

Function Introduction:

This device is used for failure analysis of components, observing voids and defects inside chips and packages.

Performance Introduction:

Scanning modes: A,B,C,D,G,P,T,X,3D scanning; scanning resolution: ±0.1um; scanning range: 420×420mm; probe highest frequency: 400MHz

Device Name: Electrostatic Discharge Tester

Manufacturer:HANWA ELECTRONIC

Function Introduction:

Used for HBM/MM model ESD testing and LATCHUP latch-up testing, with a maximum of 256 PINs.

Performance Introduction:

PIN count: 256 PINs

Maximum HBM voltage: ±8000V

Maximum MM voltage: ±4000V

Latch-up test voltage: 35V,1A

Device Name: X-ray Fluorescence Measurement System

Manufacturer: OXFORD

Function Introduction:

This device is used to test the thickness of component plating layers.

Performance Introduction:

Can simultaneously test the thickness of 4 plating layers (on substrate), resolution 1uin; spectrometer processor: 4096 channels

Device Name: Metal Package Device Opener

Manufacturer: Ruifeng Xianke Technology Co., Ltd.

Function Introduction:

This device is used for opening the caps of components.

Performance Introduction:

Opening sample size diameter: 1mm-20mm;

Device Name: ELITE ETCH ACID Opener

Manufacturer:

Function Introduction:

This device is used for non-destructive opening and analyzing the internal damage characteristics of components.

Performance Introduction:

Chemical temperature range: 20℃-250℃; liquid flow rate: 1-6ml/minute; nitrogen flow rate: 2.0lpm

Device Name: Stereomicroscope

Manufacturer: HAWK

Function Introduction:

This device is used for chip inspection and 3D imaging.

Performance Introduction:

Maximum magnification: 200×

Device Name: Optical Microscope

Manufacturer: Olympus

Function Introduction:

This device is used for chip inspection.

Performance Introduction:

Features an ultra-wide field-of-view erecting eyepiece (F.N22mm), 30°, stage size 8 inches × 8 inches, travel distance 210mm × 210mm, maximum objective magnification 100×

Device Name: Desktop Scanning Electron Microscope

Manufacturer: JEOL

Function Introduction:

This device is used for failure analysis of semiconductor products at the chip level.

Performance Introduction:

Magnification: 10 X - 60000 X